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- Low Temperature Micro Probing System(LTMP)
- Deep Level Transient Spectroscopy (DLTS)
- Hall Measurement System
- Seebeck Effect Measurement System
- System I, II, III, Optical Transmission System, SEM Cold Stage System
- X-Ray Diffractometer Thermal Stage
MMR사 장비의 특징
 저온실험에 관련된 모든 application에 맞는 최적의 장비
N2 gas를 사용하여 취급이 용이하며 새로운 Joule-Thomson Refrigerator는 70K이하의온도를
공급
High Tc Superconductor Material study, Material Research, Cooling Computer Chips for Speed,
Characterization of Semiconductor Materials, Cooling IR Detectors, Thermal Imaging 등 다양한
사용 목적에 따른 장비의 구성이 가능
LTMP(Low Temperature Micro Probing system)
- 기본온도범위 : 80K to 580K, Option : 70K to 730K
Manipulator : 2 에서 부터 7 개의 Manipulator까지 선택가능
Temperature Stability : +/- 0.05K
Temperature Accuracy : +/- 0.5K
- Maximum sample size : 25mm X 25mm
Designed for Stereo Zoom Microscope
Liquid Helium Cryostat 장착 option : 10K to 580K
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 LTMP
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Hall Measurement System
- 기본온도범위 : 80K to 580K, Option : 70K to 730K
Resistivities can be measured over the range of 1E-4 Ohm-cm to
1E13 Ohm-cm
Carrier mobilities can be measured over range of 1cm2/volt-sec
to 1E7cm2/volt-sec
Carrier concentrations can be measured over the range of
1e3cm-3 to 1E19cm-3
Van der Pauw Measurement Technique
완전한 system으로 구성되어 computer에 의해 control되며
모든 측정 및 data의 분석이 사용자의 편의에 맞게 조작되어
지도록 제작되었음.
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Hall Measurement
System
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- Seebeck Effect Measurement System (SB100)
- 기본온도범위 : 80K to 580K, Option : 70K to 730K
- Maximum thermal voltage which can be measured : +/-3mV
- Resolution : 50nV
- Mismatch of gains of reference and test channels : <0.1%
- Minimum step of the power to heater unit which determines
temperature difference across sample (900mW max.) : 0.1mW
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SB100
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System I, II
- 기본온도범위 : 80K to 580K,
- Option : 70K to 730K
- Application에 따라 chamber의 design을
제작할 수 있음.
Window 재질의 선택 : Fused silica,
KRS-5, Germanum, BEO, and others
- Noise free operation -The system operates
without microphonics
- Refrigerator Capacity : Minimum of 250mW
over the temperature range
Manual/Programmable Temperature
Controller 중 선택 가능
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SystemIIT 
- 기본온도범위 : 80K to 580K,
- Option : 70K to 730K
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- Application
Sample Cooling in FTIR or IR
spectrometers
Microscope cold stage
Diode Laser cooling and tuning
Fluid inclusion studies of rock samples
- Window 재질의 선택 : Fused silica,
KRS-5, Germanum, BEO, and others
SystemIIT
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System III
- 기본온도범위 : 80K to 580K, Option : 70K to 730K
- Integrated Circuit Cold Pad는 IC를 간단히 cold pad에 끼워
실험을 할 수 있도록 설계 되었음.
- System 윗부분의 4.5inch (11.4cm) larger glass는 clear optical
aperture를 제공함.
- Window 재질의 선택 : Fused silica, KRS-5, Germanum, BEO,
and others
- Multiple Port System : chamber의 3개 면에 있는 port로 optical
또는 electrical한 연결이 가능
- * Not available as of January, 2010
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- Application
Cooling of Integrated Circuits of up to 24 pins
Packaged Integrated Circuit Dewar
Optical measurement Dewar
Materials Characterization Dewar
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K2600 SEM Cold Stage System
- 기본온도범위 : 80K to 580K, Option : 70K to 730K
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copyright(c) 1998 Yang Electronic Systems
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