Semiautomatic DC Probe station (REL-6100 series)

Computer·ÎcontrolÇÏ¿© Ultra-Low Leakage Current¿Í Low Temperature environment¸¦ Á¦°ø,  DC parametric test, Failure Analysis, Reliability test µî¿¡ »ç¿ëÇÒ ¼ö ÀÖ½À´Ï´Ù.
 

<FEATURES>

Wafer Size : 3" to 8" of Silicon, GaAs, etc.
Travel Resolution : less than 0.1um
Chuck leakage plus noise : less than 20fA at non-thermal by patented     FemtoGuarded Chuck
Thermal chuck Temperature : -55'C to +200'C by patented MicroChamber
Software: Windows 95, Gallaxy, Wafer Mapping Control, GP-IB, RS-232C

<Application>

General electrical DC parametric test
fA level low current measurement
Low temperature Measurement

<Optional>

Laser Cutting System
Thermal Chuck System
Auto- focus Microscope
Integrated Dark Box and Vibration Isolation Table

Other model: REL-5500


REL-6100

 

 

 

 

 

 

 

 
 
 copyright(c) 1998 Yang Electronic Systems