DC Manual Probe Stations (REL-4800)

Ultra-Low Leakage Current¿Í Low Temperature environment¸¦ Á¦°ø ÇϹǷÎ,  DC parametric test, Failure Analysis, Reliability test µîÀÇ »ç¿ë¿¡ ÀûÇÕÇÕ´Ï´Ù.

 

<FEATURES>

Wafer Size : 3" to 8" of Silicon, GaAs, etc.
Travel Resolution : less than 0.1um
Chuck leakage plus noise : less than 20fA at non-thermal by patented     FemtoGuarded Chuck
Thermal chuck Temperature : -55'C to +200'C by patented MicroChamber

<Application>

General electrical DC parametric test
fA level low current measurement
Low temperature measurement

<Optional>

Laser Cutting System
Thermal Chuck System
Auto-focus Microscope
Dark Box
Vibration Isolation Table

REL-4800    

 

 

 

 

 

 

 

 
 
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