Cascade Microtech is the leader in on-wafer high-frequency and parametric test solutions and thin-film probe cards for production-level on-wafer testing.

Cascade Microtech, Inc.´Â RF/DC Electrical Test¸¦ À§ÇÑ total solutionÀ» Á¦°øÇÕ´Ï´Ù. 50ÀåÀÇ wafer¸¦ loadingÇÒ ¼ö ÀÖ´Â Fully Automatic Prober, ÇÑ À徿 ÃøÁ¤ÇÏ´Â Semi Automatic Prober, Manual Prober, ÃøÁ¤À» À§ÇÑ Cable, Tips µî Á¦¹Ý accessory, ±â¼ú Áö¿øÀ» °ø±ÞÇÕ´Ï´Ù.

 Products


A complete on-wafer probing test solution requires high-performance probes, cables, positioners, an analytical probe station and test software.

Automatic Wafer Probing System

DC Semiautomatic Probe station (REL Series)

DC Manual Probe Stations (REL Series)

DC/CV Accessories


 

RF/Microwave & DC/CV Semiautomatic Probing Systems (Summit Series)


 

RF/Microwave Manual Probing Systems(Summit Series)

Microwave Test Accessories

4-Point Probe Head & Fixture


Cascade¡¯s Pyramid Probe¢â production probe cards are used to test a variety of digital and analog integrated circuits.


Cascade's Air Coplanar¢ç Probe is a rugged microwave probe with a compliant tip for accurate, repeatable measurements on-wafer..

 News

Electro-Optical Component Test
Cascade Microtech Provides on-wafer test solutions to electro-optical compenent manufacturers. These solutions include probe stations, probes, RF calibration and test automation software used for characterizing VCSEL's high power laser bars, photodiodes, Lithium niobate modulators, and MEMS-based optical switched.

300mm Probe Station
Best-in-the world measurements for 300 mm wafers
MicroChamber¢â for dark, moisture-free, EMI-and RF-shielded measurement environment
AttoGuard¢â Shield for critical CV, IV measurements
Integrated system with built-in anti-vibration
Windows 2000/NT Prober Control Software
New advanced guarded thermal chuck

 

 


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